NSN 5961-00-082-3571 of Semiconductor Device Set - Parts Details
Alternative NSN: 5961000823571 |
Item Name: Semiconductor Device Set |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5961 Semiconductor Devices and Associated Hardware |
NIIN: 000823571 |
NCB Code: USA (00) |
Manufacturers: Dla Land And Maritime |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers 00005-1N21WEM, 00005 under NSN 5961-00-082-3571 of Semiconductor Device Set manufactured by Dla Land And Maritime.
Federal Supply Class of NSN 5961-00-082-3571 is FSC 5961 contains part details of Semiconductor Devices and Associated Hardware. Quote for your desired part numbers.
Part Number's List for NSN 5961-00-082-3571, 5961000823571
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Part No Manufacturer Item Name QTY RFQ 00005-1N21WEM Dla Land And Maritime semiconductor device set Avl RFQ 00005 Dla Land And Maritime semiconductor device set Avl RFQ
Characteristics Data of NSN 5961000823571MRC Criteria Characteristic ABBH INCLOSURE MATERIAL CERAMIC ALL SEMICONDUCTOR DEVICE DIODE ABHP OVERALL LENGTH 0.800 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.840 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE ADAV OVERALL DIAMETER 0.292 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.296 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE AFZC FUNCTION FOR WHICH DESIGNED MIXER ASDD COMPONENT FUNCTION RELATIONSHIP MATCHED ASKA COMPONENT NAME AND QUANTITY 2 SEMICONDUCTOR DEVICE DIODE AXGY MOUNTING METHOD TERMINAL ALL SEMICONDUCTOR DEVICE DIODE CBBL FEATURES PROVIDED HERMETICALLY SEALED CASE CTMZ SEMICONDUCTOR MATERIAL SILICON ALL SEMICONDUCTOR DEVICE DIODE CTQN VOLTAGE RATING IN VOLTS PER CHARACTERISTIC 75.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN CTSG MAXIMUM OPERATING TEMP PER MEASUREMENT POINT 150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE PMLC PRECIOUS MATERIAL AND LOCATION BODY SURFACE GOLD PRMT III PRECIOUS MATERIAL GOLD TEST TEST DATA DOCUMENT 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI TTQY TERMINAL TYPE AND QUANTITY 2 PIN ALL SEMICONDUCTOR DEVICE DIODE ZZZK SPECIFICATION/STANDARD DATA 81349-MIL-S-19500/232 GOVERNMENT SPECIFICATION
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 0.800 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.840 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.292 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.296 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AFZC | FUNCTION FOR WHICH DESIGNED | MIXER |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 75.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE |
PMLC | PRECIOUS MATERIAL AND LOCATION | BODY SURFACE GOLD |
PRMT | III PRECIOUS MATERIAL | GOLD |
TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI |
TTQY | TERMINAL TYPE AND QUANTITY | 2 PIN ALL SEMICONDUCTOR DEVICE DIODE |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/232 GOVERNMENT SPECIFICATION |