NSN 5961-00-532-2956 of Semiconductor Device Set - Parts Details
| Alternative NSN: 5961005322956 |
| Item Name: Semiconductor Device Set |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5961 Semiconductor Devices and Associated Hardware |
| NIIN: 005322956 |
| NCB Code: USA (00) |
| Manufacturers: Avago Technologies Us Inc Division , Hewlett Packard Co |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers 5082-2566 under NSN 5961-00-532-2956 of Semiconductor Device Set manufactured by Avago Technologies Us Inc Division, Hewlett Packard Co.
Federal Supply Class of NSN 5961-00-532-2956 is FSC 5961 contains part details of Semiconductor Devices and Associated Hardware. Quote for your desired part numbers.
Part Number's List for NSN 5961-00-532-2956, 5961005322956
Characteristics Data of NSN 5961005322956MRC Criteria Characteristic ABBH INCLOSURE MATERIAL CERAMIC ALL SEMICONDUCTOR DEVICE DIODE ABHP OVERALL LENGTH 0.230 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.300 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE ABJT TERMINAL LENGTH 1.000 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE ADAV OVERALL DIAMETER 0.085 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.107 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE AFZC FUNCTION FOR WHICH DESIGNED DETECTOR AND MIXER ASDD COMPONENT FUNCTION RELATIONSHIP MATCHED ASKA COMPONENT NAME AND QUANTITY 2 SEMICONDUCTOR DEVICE DIODE AXGY MOUNTING METHOD TERMINAL ALL SEMICONDUCTOR DEVICE DIODE CTMZ SEMICONDUCTOR MATERIAL SILICON ALL SEMICONDUCTOR DEVICE DIODE CTSG MAXIMUM OPERATING TEMP PER MEASUREMENT POINT 100.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE FEAT SPECIAL FEATURES 3.0 GHZ TEST FREQUENCY; 6.0 DECIBEL NOISE FIGURE TTQY TERMINAL TYPE AND QUANTITY 2 UNINSULATED WIRE LEAD ALL SEMICONDUCTOR DEVICE DIODE
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE |
| ABHP | OVERALL LENGTH | 0.230 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.300 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| ADAV | OVERALL DIAMETER | 0.085 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.107 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| AFZC | FUNCTION FOR WHICH DESIGNED | DETECTOR AND MIXER |
| ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
| AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 100.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE |
| FEAT | SPECIAL FEATURES | 3.0 GHZ TEST FREQUENCY; 6.0 DECIBEL NOISE FIGURE |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD ALL SEMICONDUCTOR DEVICE DIODE |