NSN 5961-01-097-2852 of Semiconductor Device Diode - Parts Details
Alternative NSN: 5961010972852 |
Item Name: Semiconductor Device Diode |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5961 Semiconductor Devices and Associated Hardware |
NIIN: 010972852 |
NCB Code: USA (01) |
Manufacturers: Microsemi Corporation , Micro Uspd Inc , Veeco Instruments , Fmc Technologies Inc , Tdk Lambda Americas Inc |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers UES803, FBL-00-140, D621-ED, 116806-006 under NSN 5961-01-097-2852 of Semiconductor Device Diode manufactured by Microsemi Corporation, Micro Uspd Inc, Veeco Instruments, Fmc Technologies Inc, Tdk Lambda Americas Inc.
Federal Supply Class of NSN 5961-01-097-2852 is FSC 5961 contains part details of Semiconductor Devices and Associated Hardware. Quote for your desired part numbers.
Part Number's List for NSN 5961-01-097-2852, 5961010972852
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Part No Manufacturer Item Name QTY RFQ UES803 Microsemi Corporation semiconductor device diode Avl RFQ UES803 Micro Uspd Inc semiconductor device diode Avl RFQ FBL-00-140 Veeco Instruments semiconductor device diode Avl RFQ D621-ED Fmc Technologies Inc semiconductor device diode Avl RFQ D621-ED Microsemi Corporation semiconductor device diode Avl RFQ 116806-006 Tdk Lambda Americas Inc semiconductor device diode Avl RFQ
Characteristics Data of NSN 5961010972852MRC Criteria Characteristic ABBH INCLOSURE MATERIAL METAL ABHP OVERALL LENGTH 0.450 INCHES MAXIMUM AKPV MOUNTING FACILITY QUANTITY 1 ALAZ JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION DO-5 AXGY MOUNTING METHOD THREADED STUD CBBL FEATURES PROVIDED HERMETICALLY SEALED CASE CCDG OVERALL WIDTH ACROSS FLATS 0.667 INCHES MINIMUM AND 0.687 INCHES MAXIMUM CQJX NOMINAL THREAD SIZE 0.250 INCHES CTMZ SEMICONDUCTOR MATERIAL SILICON CTQN VOLTAGE RATING IN VOLTS PER CHARACTERISTIC 2.1 MAXIMUM FORWARD VOLTAGE, AVERAGE CTQX CURRENT RATING PER CHARACTERISTIC 1.00 AMPERES SOURCE CUTOFF CURRENT PRESET CTSG MAXIMUM OPERATING TEMP PER MEASUREMENT POINT 150.0 DEG CELSIUS JUNCTION THSD THREAD SERIES DESIGNATOR UNF TTQY TERMINAL TYPE AND QUANTITY 1 TAB, SOLDER LUG AND 1 THREADED STUD
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | METAL |
ABHP | OVERALL LENGTH | 0.450 INCHES MAXIMUM |
AKPV | MOUNTING FACILITY QUANTITY | 1 |
ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | DO-5 |
AXGY | MOUNTING METHOD | THREADED STUD |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
CCDG | OVERALL WIDTH ACROSS FLATS | 0.667 INCHES MINIMUM AND 0.687 INCHES MAXIMUM |
CQJX | NOMINAL THREAD SIZE | 0.250 INCHES |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 2.1 MAXIMUM FORWARD VOLTAGE, AVERAGE |
CTQX | CURRENT RATING PER CHARACTERISTIC | 1.00 AMPERES SOURCE CUTOFF CURRENT PRESET |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION |
THSD | THREAD SERIES DESIGNATOR | UNF |
TTQY | TERMINAL TYPE AND QUANTITY | 1 TAB, SOLDER LUG AND 1 THREADED STUD |