NSN 5962-00-087-9795 of Microcircuit Digital - Parts Details
Alternative NSN: 5962000879795 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 000879795 |
NCB Code: USA (00) |
Manufacturers: Texas Instrument Inc , Bae Systems Information And Electronic Systems Integration Inc Div Bae Systems , American Transcoil Corp , L 3 Communications |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers SN1791, SMC583557, SM-C-583557, 398511 under NSN 5962-00-087-9795 of Microcircuit Digital manufactured by Texas Instrument Inc, Bae Systems Information And Electronic Systems Integration Inc Div Bae Systems, American Transcoil Corp, L 3 Communications.
Federal Supply Class of NSN 5962-00-087-9795 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-00-087-9795, 5962000879795
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Part No Manufacturer Item Name QTY RFQ SN1791 Texas Instrument Inc microcircuit digital Avl RFQ SMC583557 Bae Systems Information And Electronic Systems Integration Inc Div Bae Systems microcircuit digital Avl RFQ SM-C-583557 American Transcoil Corp microcircuit digital Avl RFQ 398511 L 3 Communications microcircuit digital Avl RFQ
Characteristics Data of NSN 5962000879795MRC Criteria Characteristic ADAQ BODY LENGTH 0.685 INCHES MINIMUM AND 0.715 INCHES MAXIMUM ADAT BODY WIDTH 0.235 INCHES MINIMUM AND 0.265 INCHES MAXIMUM ADAU BODY HEIGHT 0.060 INCHES MINIMUM AND 0.100 INCHES MAXIMUM AFGA OPERATING TEMP RANGE -40.0 TO 85.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED MONOLITHIC AND HERMETICALLY SEALED CQSJ INCLOSURE MATERIAL CERAMIC OR METAL CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN 6 INPUT CZEQ TIME RATING PER CHACTERISTIC 100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT TEST TEST DATA DOCUMENT 80063-SM-C-583557 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.685 INCHES MINIMUM AND 0.715 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.235 INCHES MINIMUM AND 0.265 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.060 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -40.0 TO 85.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED |
CQSJ | INCLOSURE MATERIAL | CERAMIC OR METAL |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 6 INPUT |
CZEQ | TIME RATING PER CHACTERISTIC | 100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 80063-SM-C-583557 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING |