NSN 5962-00-147-7929 of Microcircuit Linear - Parts Details
| Alternative NSN: 5962001477929 |
| Item Name: Microcircuit Linear |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 001477929 |
| NCB Code: USA (00) |
| Manufacturers: Texas Instrument Inc , Fairchild Semiconductor Corp , Itt Semiconductors Division , Freescale Semiconductor Inc , Lacon Electronic Gmbh , Adelco Elektronik Gmbh , National Semiconductor Corp , Electrodynamics Inc , Edo Ail Systems Inc , Raytheon Aircraft , Selex Communications Gmbh , Bae Systems |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers UA710AML 883B 00, UA710AHMQB, SNC52710L, SNC52710AL, QA27710BC under NSN 5962-00-147-7929 of Microcircuit Linear manufactured by Texas Instrument Inc, Fairchild Semiconductor Corp, Itt Semiconductors Division, Freescale Semiconductor Inc, Lacon Electronic Gmbh.
Federal Supply Class of NSN 5962-00-147-7929 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-00-147-7929, 5962001477929
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Part No Manufacturer Item Name QTY RFQ UA710AML 883B 00 Texas Instrument Inc microcircuit linear Avl RFQ UA710AHMQB Fairchild Semiconductor Corp microcircuit linear Avl RFQ SNC52710L Texas Instrument Inc microcircuit linear Avl RFQ SNC52710AL Texas Instrument Inc microcircuit linear Avl RFQ QA27710BC Fairchild Semiconductor Corp microcircuit linear Avl RFQ NC3209-710-1C Itt Semiconductors Division microcircuit linear Avl RFQ MC170GB2 Freescale Semiconductor Inc microcircuit linear Avl RFQ LM710H 883BA Lacon Electronic Gmbh microcircuit linear Avl RFQ LM710H 883BA Adelco Elektronik Gmbh microcircuit linear Avl RFQ LM710H 883B National Semiconductor Corp microcircuit linear Avl RFQ LM710AH 883B National Semiconductor Corp microcircuit linear Avl RFQ 7100056-1 Electrodynamics Inc microcircuit linear Avl RFQ 710-1C883 Itt Semiconductors Division microcircuit linear Avl RFQ 600269-01 Edo Ail Systems Inc microcircuit linear Avl RFQ 536930-1 Raytheon Aircraft microcircuit linear Avl RFQ 4-54137P Selex Communications Gmbh microcircuit linear Avl RFQ 310033P4 Bae Systems microcircuit linear Avl RFQ 1310014P1 Bae Systems microcircuit linear Avl RFQ
Characteristics Data of NSN 5962001477929MRC Criteria Characteristic ADAR BODY OUTSIDE DIAMETER 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM ADAU BODY HEIGHT 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM AEHX MAXIMUM POWER DISSIPATION RATING 300.0 MILLIWATTS AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED POSITIVE OUTPUTS AND MONOLITHIC AND HERMETICALLY SEALED AND HIGH SPEED AND NEGATIVE OUTPUTS CQSJ INCLOSURE MATERIAL GLASS AND METAL CQSZ INCLOSURE CONFIGURATION CAN CQZP INPUT CIRCUIT PATTERN 2 INPUT CSSL DESIGN FUNCTION AND QUANTITY 1 COMPARATOR, VOLTAGE, DIFFERENTIAL CTFT CASE OUTLINE SOURCE AND DESIGNATOR T0.99 JOINT ELECTRON DEVICE ENGINEERING COUNCIL CWSG TERMINAL SURFACE TREATMENT GOLD CZEQ TIME RATING PER CHACTERISTIC 40.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT PMLC PRECIOUS MATERIAL AND LOCATION TERMINALS GOLD PRMT PRECIOUS MATERIAL GOLD TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAR | BODY OUTSIDE DIAMETER | 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 300.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | POSITIVE OUTPUTS AND MONOLITHIC AND HERMETICALLY SEALED AND HIGH SPEED AND NEGATIVE OUTPUTS |
| CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
| CQSZ | INCLOSURE CONFIGURATION | CAN |
| CQZP | INPUT CIRCUIT PATTERN | 2 INPUT |
| CSSL | DESIGN FUNCTION AND QUANTITY | 1 COMPARATOR, VOLTAGE, DIFFERENTIAL |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0.99 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CWSG | TERMINAL SURFACE TREATMENT | GOLD |
| CZEQ | TIME RATING PER CHACTERISTIC | 40.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| PMLC | PRECIOUS MATERIAL AND LOCATION | TERMINALS GOLD |
| PRMT | PRECIOUS MATERIAL | GOLD |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |