NSN 5962-00-175-4564 of Microcircuit Linear - Parts Details
| Alternative NSN: 5962001754564 |
| Item Name: Microcircuit Linear |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 001754564 |
| NCB Code: USA (00) |
| Manufacturers: Fairchild Semiconductor Corp , Texas Instrument Inc , Philips Semiconductors Inc , Edo Corporation |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers U5B7709393, SN72709L, SN16131, SL21488, CE215T under NSN 5962-00-175-4564 of Microcircuit Linear manufactured by Fairchild Semiconductor Corp, Texas Instrument Inc, Philips Semiconductors Inc, Edo Corporation.
Federal Supply Class of NSN 5962-00-175-4564 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-00-175-4564, 5962001754564
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Part No Manufacturer Item Name QTY RFQ U5B7709393 Fairchild Semiconductor Corp microcircuit linear Avl RFQ SN72709L Texas Instrument Inc microcircuit linear Avl RFQ SN16131 Texas Instrument Inc microcircuit linear Avl RFQ SL21488 Fairchild Semiconductor Corp microcircuit linear Avl RFQ CE215T Philips Semiconductors Inc microcircuit linear Avl RFQ 373728-2 Edo Corporation microcircuit linear Avl RFQ
Characteristics Data of NSN 5962001754564MRC Criteria Characteristic ADAR BODY OUTSIDE DIAMETER 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM ADAU BODY HEIGHT 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM AEHX MAXIMUM POWER DISSIPATION RATING 250.0 MILLIWATTS AFGA OPERATING TEMP RANGE -0.0 TO 85.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED MONOLITHIC AND HERMETICALLY SEALED AND HIGH SPEED AND HIGH GAIN AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS AND EXTERNALLY COMPENSATED CQSJ INCLOSURE MATERIAL GLASS AND METAL CQSZ INCLOSURE CONFIGURATION CAN CQZP INPUT CIRCUIT PATTERN 4 INPUT CTFT CASE OUTLINE SOURCE AND DESIGNATOR T0-99 JOINT ELECTRON DEVICE ENGINEERING COUNCIL CWSG TERMINAL SURFACE TREATMENT GOLD CZEQ TIME RATING PER CHACTERISTIC 1.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT PMLC III PRECIOUS MATERIAL AND LOCATION TERMINALS GOLD PRMT III PRECIOUS MATERIAL GOLD TEST TEST DATA DOCUMENT 00752-373728 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWI
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAR | BODY OUTSIDE DIAMETER | 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 250.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | -0.0 TO 85.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED AND HIGH SPEED AND HIGH GAIN AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS AND EXTERNALLY COMPENSATED |
| CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
| CQSZ | INCLOSURE CONFIGURATION | CAN |
| CQZP | INPUT CIRCUIT PATTERN | 4 INPUT |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-99 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CWSG | TERMINAL SURFACE TREATMENT | GOLD |
| CZEQ | TIME RATING PER CHACTERISTIC | 1.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| PMLC | III PRECIOUS MATERIAL AND LOCATION | TERMINALS GOLD |
| PRMT | III PRECIOUS MATERIAL | GOLD |
| TEST | TEST DATA DOCUMENT | 00752-373728 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWI |