NSN 5962-00-180-5085 of Microcircuit Linear - Parts Details
Alternative NSN: 5962001805085 |
Item Name: Microcircuit Linear |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 001805085 |
NCB Code: USA (00) |
Manufacturers: Fairchild Semiconductor Corp , Paeaeesikunta Logistiikkaosasto |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers U5F7723312, 723HM, 457-6028 under NSN 5962-00-180-5085 of Microcircuit Linear manufactured by Fairchild Semiconductor Corp, Paeaeesikunta Logistiikkaosasto.
Federal Supply Class of NSN 5962-00-180-5085 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-00-180-5085, 5962001805085
Characteristics Data of NSN 5962001805085MRC Criteria Characteristic ADAR BODY OUTSIDE DIAMETER 0.370 INCHES MAXIMUM ADAU BODY HEIGHT 0.260 INCHES MAXIMUM AEHX MAXIMUM POWER DISSIPATION RATING 800.0 MILLIWATTS AFGA OPERATING TEMP RANGE -55.0 TO 125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED MONOLITHIC AND HERMETICALLY SEALED CQSJ INCLOSURE MATERIAL METAL CQSZ INCLOSURE CONFIGURATION CAN CQZP INPUT CIRCUIT PATTERN 2 INPUT CSSL DESIGN FUNCTION AND QUANTITY 1 REGULATOR, VOLTAGE CTFT CASE OUTLINE SOURCE AND DESIGNATOR TO-96 JOINT ELECTRON DEVICE ENGINEERING COUNCIL CWSG TERMINAL SURFACE TREATMENT SOLDER TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
MRC | Criteria | Characteristic |
---|---|---|
ADAR | BODY OUTSIDE DIAMETER | 0.370 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.260 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 800.0 MILLIWATTS |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED |
CQSJ | INCLOSURE MATERIAL | METAL |
CQSZ | INCLOSURE CONFIGURATION | CAN |
CQZP | INPUT CIRCUIT PATTERN | 2 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 REGULATOR, VOLTAGE |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | TO-96 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |