NSN 5962-00-758-7517 of Microcircuit Digital - Parts Details
| Alternative NSN: 5962007587517 |
| Item Name: Microcircuit Digital |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 007587517 |
| NCB Code: USA (00) |
| Manufacturers: Texas Instrument Inc , National Semiconductor Corp , Rockwell Collins Inc |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers SN14833, 54L72SD7730A, 351-7365-092 under NSN 5962-00-758-7517 of Microcircuit Digital manufactured by Texas Instrument Inc, National Semiconductor Corp, Rockwell Collins Inc.
Federal Supply Class of NSN 5962-00-758-7517 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-00-758-7517, 5962007587517
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Part No Manufacturer Item Name QTY RFQ SN14833 Texas Instrument Inc microcircuit digital Avl RFQ 54L72SD7730A National Semiconductor Corp microcircuit digital Avl RFQ 351-7365-092 Rockwell Collins Inc microcircuit digital Avl RFQ
Characteristics Data of NSN 5962007587517MRC Criteria Characteristic ADAT BODY WIDTH 0.200 INCHES MINIMUM AND 0.300 INCHES MAXIMUM ADAU BODY HEIGHT 0.008 INCHES MINIMUM AND 0.100 INCHES MAXIMUM AEHX MAXIMUM POWER DISSIPATION RATING 11.0 MILLIWATTS AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND EDGE TRIGGERED AND LOW POWER AND PRESETTABLE AND W/CLEAR CQSZ INCLOSURE CONFIGURATION FLAT PACK CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN 9 INPUT CSSL DESIGN FUNCTION AND QUANTITY 1 FLIP-FLOP, J-K, AND INPUT MASTER SLAVE AND 1 FLIP-FLOP, J-K, CLOCKED CTFT CASE OUTLINE SOURCE AND DESIGNATOR -0-004-AA JOINT ELECTRON DEVICE ENGINEERING COUNCIL CZEQ TIME RATING PER CHACTERISTIC 125.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 200.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). ADAQ BODY LENGTH 0.337 INCHES MINIMUM AND 0.350 INCHES MAXIMUM CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAT | BODY WIDTH | 0.200 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.008 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 11.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND EDGE TRIGGERED AND LOW POWER AND PRESETTABLE AND W/CLEAR |
| CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 9 INPUT |
| CSSL | DESIGN FUNCTION AND QUANTITY | 1 FLIP-FLOP, J-K, AND INPUT MASTER SLAVE AND 1 FLIP-FLOP, J-K, CLOCKED |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | -0-004-AA JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CZEQ | TIME RATING PER CHACTERISTIC | 125.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 200.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| ADAQ | BODY LENGTH | 0.337 INCHES MINIMUM AND 0.350 INCHES MAXIMUM |
| CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |