NSN 5962-01-009-1470 of Microcircuit Digital - Parts Details
| Alternative NSN: 5962010091470 |
| Item Name: Microcircuit Digital |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 010091470 |
| NCB Code: USA (01) |
| Manufacturers: Texas Instrument Inc , Philips Semiconductors Inc , National Semiconductor Corp |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers SNC5420W, SN5420Q, SN5420F 883B under NSN 5962-01-009-1470 of Microcircuit Digital manufactured by Texas Instrument Inc, Philips Semiconductors Inc, National Semiconductor Corp.
Federal Supply Class of NSN 5962-01-009-1470 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-009-1470, 5962010091470
Characteristics Data of NSN 5962010091470MRC Criteria Characteristic CBBL Features Provided BURN IN AND AFJQ Storage Temp Range -65.0 TO 150.0 DEG CELSIUS TEST Test Data Document 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). CQZP Input Circuit Pattern DUAL 4 INPUT ADAT Body Width 0.270 INCHES MAXIMUM CQSJ Inclosure Material CERAMIC CSSL Design Function And Quantity 2 GATE, NAND CBBL Features Provided HERMETICALLY SEALED AND CBBL Features Provided POSITIVE OUTPUTS ADAQ Body Length 0.385 INCHES MAXIMUM CQSZ Inclosure Configuration FLAT PACK MRC Decoded Requirement Clear Text Reply AEHX Maximum Power Dissipation Rating 80.0 MILLIWATTS ADAU Body Height 0.080 INCHES MAXIMUM CBBL Features Provided MONOLITHIC AND AFGA Operating Temp Range -55.0 TO 125.0 DEG CELSIUS CZEQ Time Rating Per Chacteristic 22.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND CZEQ Time Rating Per Chacteristic 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT CQWX Output Logic Form TRANSISTOR-TRANSISTOR LOGIC
| MRC | Criteria | Characteristic |
|---|---|---|
| CBBL | Features Provided | BURN IN AND |
| AFJQ | Storage Temp Range | -65.0 TO 150.0 DEG CELSIUS |
| TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CQZP | Input Circuit Pattern | DUAL 4 INPUT |
| ADAT | Body Width | 0.270 INCHES MAXIMUM |
| CQSJ | Inclosure Material | CERAMIC |
| CSSL | Design Function And Quantity | 2 GATE, NAND |
| CBBL | Features Provided | HERMETICALLY SEALED AND |
| CBBL | Features Provided | POSITIVE OUTPUTS |
| ADAQ | Body Length | 0.385 INCHES MAXIMUM |
| CQSZ | Inclosure Configuration | FLAT PACK |
| MRC | Decoded Requirement | Clear Text Reply |
| AEHX | Maximum Power Dissipation Rating | 80.0 MILLIWATTS |
| ADAU | Body Height | 0.080 INCHES MAXIMUM |
| CBBL | Features Provided | MONOLITHIC AND |
| AFGA | Operating Temp Range | -55.0 TO 125.0 DEG CELSIUS |
| CZEQ | Time Rating Per Chacteristic | 22.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND |
| CZEQ | Time Rating Per Chacteristic | 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |