NSN 5962-01-010-8584 of Microcircuit Digital - Parts Details
Alternative NSN: 5962010108584 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 010108584 |
NCB Code: USA (01) |
Manufacturers: Rochester Electronics Llc , Rockwell Collins Inc , National Semiconductor Corp , Texas Instrument Inc |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers 54L55W B, 54L55W C, 619-3536-001, DM54L55F 883B, DM54L55F 883S under NSN 5962-01-010-8584 of Microcircuit Digital manufactured by Rochester Electronics Llc, Rockwell Collins Inc, National Semiconductor Corp, Texas Instrument Inc.
Federal Supply Class of NSN 5962-01-010-8584 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-010-8584, 5962010108584
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Part No Manufacturer Item Name QTY RFQ 54L55W B Rochester Electronics Llc microcircuit digital Avl RFQ 54L55W C Rochester Electronics Llc microcircuit digital Avl RFQ 619-3536-001 Rockwell Collins Inc microcircuit digital Avl RFQ DM54L55F 883B National Semiconductor Corp microcircuit digital Avl RFQ DM54L55F 883S National Semiconductor Corp microcircuit digital Avl RFQ DM54L55W 883B National Semiconductor Corp microcircuit digital Avl RFQ SNC54L55T Texas Instrument Inc microcircuit digital Avl RFQ SNC54L55W Texas Instrument Inc microcircuit digital Avl RFQ
Characteristics Data of NSN 5962010108584MRC Criteria Characteristic ADAQ BODY LENGTH 0.275 INCHES MAXIMUM ADAT BODY WIDTH 0.275 INCHES MAXIMUM ADAU BODY HEIGHT 0.080 INCHES MAXIMUM AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED LOW POWER AND HERMETICALLY SEALED CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS CQSZ INCLOSURE CONFIGURATION FLAT PACK CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN 2 WIDE 4 INPUT CSSL DESIGN FUNCTION AND QUANTITY 1 GATE, AND-OR INVERT CZEQ TIME RATING PER CHACTERISTIC 90.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 60.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.275 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.275 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.080 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | LOW POWER AND HERMETICALLY SEALED |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 2 WIDE 4 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 GATE, AND-OR INVERT |
CZEQ | TIME RATING PER CHACTERISTIC | 90.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 60.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |