NSN 5962-01-030-9495 of Microcircuit Linear - Parts Details
| Alternative NSN: 5962010309495 |
| Item Name: Microcircuit Linear |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 010309495 |
| NCB Code: USA (01) |
| Manufacturers: Advanced Micro Devices Inc , Thales Nederland , Autek Systems Corp |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers AM686HM1N, AM686HM, AM68631U, 3522 500 25774, 178 686 under NSN 5962-01-030-9495 of Microcircuit Linear manufactured by Advanced Micro Devices Inc, Thales Nederland, Autek Systems Corp.
Federal Supply Class of NSN 5962-01-030-9495 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-030-9495, 5962010309495
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Part No Manufacturer Item Name QTY RFQ AM686HM1N Advanced Micro Devices Inc microcircuit linear Avl RFQ AM686HM Advanced Micro Devices Inc microcircuit linear Avl RFQ AM68631U Advanced Micro Devices Inc microcircuit linear Avl RFQ 3522 500 25774 Thales Nederland microcircuit linear Avl RFQ 178 686 Autek Systems Corp microcircuit linear Avl RFQ
Characteristics Data of NSN 5962010309495MRC Criteria Characteristic ADAR BODY OUTSIDE DIAMETER 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM ADAU BODY HEIGHT 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM AEHX MAXIMUM POWER DISSIPATION RATING 600.0 MILLIWATTS AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS AGAV END ITEM IDENTIFICATION TEST STATION DISPLAY FSCM 81755 CBBL FEATURES PROVIDED HERMETICALLY SEALED AND MONOLITHIC AND HIGH SPEED AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS CQSJ INCLOSURE MATERIAL GLASS AND METAL CQSZ INCLOSURE CONFIGURATION CAN CQZP INPUT CIRCUIT PATTERN 2 INPUT CSSL DESIGN FUNCTION AND QUANTITY 1 COMPARATOR, VOLTAGE, DIFFERENTIAL CTFT CASE OUTLINE SOURCE AND DESIGNATOR T0-100 JOINT ELECTRON DEVICE ENGINEERING COUNCIL CWSG TERMINAL SURFACE TREATMENT TIN CZEQ TIME RATING PER CHACTERISTIC 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAR | BODY OUTSIDE DIAMETER | 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 600.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| AGAV | END ITEM IDENTIFICATION | TEST STATION DISPLAY FSCM 81755 |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND HIGH SPEED AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS |
| CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
| CQSZ | INCLOSURE CONFIGURATION | CAN |
| CQZP | INPUT CIRCUIT PATTERN | 2 INPUT |
| CSSL | DESIGN FUNCTION AND QUANTITY | 1 COMPARATOR, VOLTAGE, DIFFERENTIAL |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-100 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CWSG | TERMINAL SURFACE TREATMENT | TIN |
| CZEQ | TIME RATING PER CHACTERISTIC | 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |