NSN 5962-01-031-4237 of Microcircuit Digital - Parts Details
Alternative NSN: 5962010314237 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 010314237 |
NCB Code: USA (01) |
Manufacturers: Bae Systems , Itt Semiconductors Division , Fairchild Semiconductor Corp , National Semiconductor Corp , Philips Semiconductors Inc , Texas Instrument Inc , Sprague Electric Co World Hqs |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers 310346P1, 5473B 883C, 5473FMQC, DM5473F 883C, RC5473W under NSN 5962-01-031-4237 of Microcircuit Digital manufactured by Bae Systems, Itt Semiconductors Division, Fairchild Semiconductor Corp, National Semiconductor Corp, Philips Semiconductors Inc.
Federal Supply Class of NSN 5962-01-031-4237 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-031-4237, 5962010314237
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Part No Manufacturer Item Name QTY RFQ 310346P1 Bae Systems microcircuit digital Avl RFQ 5473B 883C Itt Semiconductors Division microcircuit digital Avl RFQ 5473FMQC Fairchild Semiconductor Corp microcircuit digital Avl RFQ DM5473F 883C National Semiconductor Corp microcircuit digital Avl RFQ RC5473W Philips Semiconductors Inc microcircuit digital Avl RFQ SNM5473W Texas Instrument Inc microcircuit digital Avl RFQ US5473J 883C Sprague Electric Co World Hqs microcircuit digital Avl RFQ
Characteristics Data of NSN 5962010314237MRC Criteria Characteristic ADAQ BODY LENGTH 0.235 INCHES MINIMUM AND 0.385 INCHES MAXIMUM ADAT BODY WIDTH 0.140 INCHES MINIMUM AND 0.260 INCHES MAXIMUM ADAU BODY HEIGHT 0.070 INCHES MAXIMUM AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED HERMETICALLY SEALED AND MONOLITHIC AND LOW POWER AND W/CLEAR AND W/ENABLE CQSJ INCLOSURE MATERIAL CERAMIC CQSZ INCLOSURE CONFIGURATION FLAT PACK CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN DUAL 4 INPUT CSSL DESIGN FUNCTION AND QUANTITY 2 FLIP-FLOP, J-K, MASTER SLAVE CZEQ TIME RATING PER CHACTERISTIC 25.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 40.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT TEST TEST DATA DOCUMENT 94117-310346 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWI
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.235 INCHES MINIMUM AND 0.385 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.140 INCHES MINIMUM AND 0.260 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.070 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND LOW POWER AND W/CLEAR AND W/ENABLE |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | DUAL 4 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 2 FLIP-FLOP, J-K, MASTER SLAVE |
CZEQ | TIME RATING PER CHACTERISTIC | 25.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 40.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 94117-310346 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWI |