NSN 5962-01-086-0296 of Microcircuit Digital - Parts Details
Alternative NSN: 5962010860296 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 010860296 |
NCB Code: USA (01) |
Manufacturers: Rockwell Collins Inc , Bae Systems , G E C Marconi Communications Ltd , Raytheon Aircraft , Texas Instrument Inc |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers 34 861-048, 445 4 13239 011, 802419-1, SNJ54LS11J, SNJ54LS11J-00 under NSN 5962-01-086-0296 of Microcircuit Digital manufactured by Rockwell Collins Inc, Bae Systems, G E C Marconi Communications Ltd, Raytheon Aircraft, Texas Instrument Inc.
Federal Supply Class of NSN 5962-01-086-0296 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-086-0296, 5962010860296
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Part No Manufacturer Item Name QTY RFQ 34 861-048 Rockwell Collins Inc microcircuit digital Avl RFQ 445 4 13239 011 Bae Systems microcircuit digital Avl RFQ 445 4 13239 011 G E C Marconi Communications Ltd microcircuit digital Avl RFQ 802419-1 Raytheon Aircraft microcircuit digital Avl RFQ SNJ54LS11J Texas Instrument Inc microcircuit digital Avl RFQ SNJ54LS11J-00 Texas Instrument Inc microcircuit digital Avl RFQ
Characteristics Data of NSN 5962010860296MRC Criteria Characteristic ABKW OVERALL HEIGHT 0.330 INCHES NOMINAL ADAQ BODY LENGTH 0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM ADAT BODY WIDTH 0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM ADAU BODY HEIGHT 0.180 INCHES NOMINAL AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED LOW POWER AND SCHOTTKY AND HERMETICALLY SEALED AND MONOLITHIC AND W/RESISTOR CQSJ INCLOSURE MATERIAL CERAMIC CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN TRIPLE 3 INPUT CSSL DESIGN FUNCTION AND QUANTITY 3 GATE, AND CZEQ TIME RATING PER CHACTERISTIC 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
MRC | Criteria | Characteristic |
---|---|---|
ABKW | OVERALL HEIGHT | 0.330 INCHES NOMINAL |
ADAQ | BODY LENGTH | 0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.180 INCHES NOMINAL |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | LOW POWER AND SCHOTTKY AND HERMETICALLY SEALED AND MONOLITHIC AND W/RESISTOR |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | TRIPLE 3 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 3 GATE, AND |
CZEQ | TIME RATING PER CHACTERISTIC | 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |