NSN 5962-01-086-7624 of Microcircuit Digital - Parts Details
Alternative NSN: 5962010867624 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 010867624 |
NCB Code: USA (01) |
Manufacturers: Texas Instrument Inc , Bae Systems , G E C Marconi Communications Ltd , Rockwell Collins Inc , Racal Survey Inc Div Of Racal Da , Thales Uk Limited |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers SNJ5406J10, SNJ5406J, 445 4 13239 005, 34 871-007, 1855239 under NSN 5962-01-086-7624 of Microcircuit Digital manufactured by Texas Instrument Inc, Bae Systems, G E C Marconi Communications Ltd, Rockwell Collins Inc, Racal Survey Inc Div Of Racal Da.
Federal Supply Class of NSN 5962-01-086-7624 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-086-7624, 5962010867624
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Part No Manufacturer Item Name QTY RFQ SNJ5406J10 Texas Instrument Inc microcircuit digital Avl RFQ SNJ5406J Texas Instrument Inc microcircuit digital Avl RFQ 445 4 13239 005 Bae Systems microcircuit digital Avl RFQ 445 4 13239 005 G E C Marconi Communications Ltd microcircuit digital Avl RFQ 34 871-007 Rockwell Collins Inc microcircuit digital Avl RFQ 1855239 Racal Survey Inc Div Of Racal Da microcircuit digital Avl RFQ 1855239 Thales Uk Limited microcircuit digital Avl RFQ
Characteristics Data of NSN 5962010867624MRC Criteria Characteristic ADAQ BODY LENGTH 0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM ADAT BODY WIDTH 0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM ADAU BODY HEIGHT 0.180 INCHES MAXIMUM AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED W/OPEN COLLECTOR AND HIGH VOLTAGE AND HIGH CURRENT CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN HEX 1 INPUT CSSL DESIGN FUNCTION AND QUANTITY 6 BUFFER, INVERTING CZEQ TIME RATING PER CHACTERISTIC 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 23.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.180 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | W/OPEN COLLECTOR AND HIGH VOLTAGE AND HIGH CURRENT |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | HEX 1 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 6 BUFFER, INVERTING |
CZEQ | TIME RATING PER CHACTERISTIC | 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 23.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |