NSN 5962-01-108-0811 of Microcircuit Memory - Parts Details
| Alternative NSN: 5962011080811 |
| Item Name: Microcircuit Memory |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 011080811 |
| NCB Code: USA (01) |
| Manufacturers: Texas Instrument Inc , Fairchild Semiconductor Corp , Freescale Semiconductor Inc , Mmi Amd , National Semiconductor Corp , Philips Semiconductors Inc , Trw Electronic Components Division |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers SN84538N, SN74S201, MPM10102J, 63A130837P1 under NSN 5962-01-108-0811 of Microcircuit Memory manufactured by Texas Instrument Inc, Fairchild Semiconductor Corp, Freescale Semiconductor Inc, Mmi Amd, National Semiconductor Corp.
Federal Supply Class of NSN 5962-01-108-0811 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-108-0811, 5962011080811
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Part No Manufacturer Item Name QTY RFQ SN84538N Texas Instrument Inc microcircuit memory Avl RFQ SN74S201 Texas Instrument Inc microcircuit memory Avl RFQ MPM10102J Texas Instrument Inc microcircuit memory Avl RFQ 63A130837P1 Fairchild Semiconductor Corp microcircuit memory Avl RFQ 63A130837P1 Freescale Semiconductor Inc microcircuit memory Avl RFQ 63A130837P1 Mmi Amd microcircuit memory Avl RFQ 63A130837P1 National Semiconductor Corp microcircuit memory Avl RFQ 63A130837P1 Philips Semiconductors Inc microcircuit memory Avl RFQ 63A130837P1 Texas Instrument Inc microcircuit memory Avl RFQ 63A130837P1 Trw Electronic Components Division microcircuit memory Avl RFQ
Characteristics Data of NSN 5962011080811MRC Criteria Characteristic ADAQ BODY LENGTH 0.870 INCHES MAXIMUM ADAT BODY WIDTH 0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM ADAU BODY HEIGHT 0.180 INCHES MAXIMUM AFGA OPERATING TEMP RANGE +0.0/+70.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED BIPOLAR AND W/ENABLE AND 3-STATE OUTPUT CQSJ INCLOSURE MATERIAL PLASTIC CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN 13 INPUT CWSG TERMINAL SURFACE TREATMENT SOLDER CZER MEMORY DEVICE TYPE RAM TEST TEST DATA DOCUMENT 16331-63A130837 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DR TTQY TERMINAL TYPE AND QUANTITY 16 PRINTED CIRCUIT
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 0.870 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.180 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | +0.0/+70.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | BIPOLAR AND W/ENABLE AND 3-STATE OUTPUT |
| CQSJ | INCLOSURE MATERIAL | PLASTIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 13 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZER | MEMORY DEVICE TYPE | RAM |
| TEST | TEST DATA DOCUMENT | 16331-63A130837 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DR |
| TTQY | TERMINAL TYPE AND QUANTITY | 16 PRINTED CIRCUIT |