NSN 5962-01-118-6295 of Microcircuit Digital - Parts Details
Alternative NSN: 5962011186295 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 011186295 |
NCB Code: USA (01) |
Manufacturers: Honeywell International Inc , Itt Semiconductors Division , Texas Instrument Inc , Adelco Elektronik Gmbh , Lacon Electronic Gmbh |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers 431-016-9039, 54181DM, SNJ54181J, SNJ54181J00, SNJ54181JA under NSN 5962-01-118-6295 of Microcircuit Digital manufactured by Honeywell International Inc, Itt Semiconductors Division, Texas Instrument Inc, Adelco Elektronik Gmbh, Lacon Electronic Gmbh.
Federal Supply Class of NSN 5962-01-118-6295 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-118-6295, 5962011186295
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Part No Manufacturer Item Name QTY RFQ 431-016-9039 Honeywell International Inc microcircuit digital Avl RFQ 54181DM Itt Semiconductors Division microcircuit digital Avl RFQ SNJ54181J Texas Instrument Inc microcircuit digital Avl RFQ SNJ54181J Adelco Elektronik Gmbh microcircuit digital Avl RFQ SNJ54181J Lacon Electronic Gmbh microcircuit digital Avl RFQ SNJ54181J00 Texas Instrument Inc microcircuit digital Avl RFQ SNJ54181JA Adelco Elektronik Gmbh microcircuit digital Avl RFQ
Characteristics Data of NSN 5962011186295MRC Criteria Characteristic ADAQ BODY LENGTH 1.290 INCHES MAXIMUM ADAT BODY WIDTH 0.300 INCHES MAXIMUM ADAU BODY HEIGHT 0.180 INCHES MAXIMUM AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED HERMETICALLY SEALED AND BURN IN AND HIGH SPEED AND MONOLITHIC CQSJ INCLOSURE MATERIAL CERAMIC CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN 14 INPUT CSSL DESIGN FUNCTION AND QUANTITY 1 ARITHMETIC LOGIC UNIT AND 1 GENERATOR, FUNCTION CTFT CASE OUTLINE SOURCE AND DESIGNATOR MO-015AA JOINT ELECTRON DEVICE ENGINEERING COUNCIL CZEQ TIME RATING PER CHACTERISTIC 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 1.290 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.300 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.180 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND HIGH SPEED AND MONOLITHIC |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 ARITHMETIC LOGIC UNIT AND 1 GENERATOR, FUNCTION |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | MO-015AA JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CZEQ | TIME RATING PER CHACTERISTIC | 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |