NSN 5962-01-201-1414 of Microcircuit Memory - Parts Details
Alternative NSN: 5962012011414 |
Item Name: Microcircuit Memory |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 012011414 |
NCB Code: USA (01) |
Manufacturers: Texas Instrument Inc , Intel Corp Sales Office , Owen Laboratories Inc , Advanced Micro Devices Inc , Dla Land And Maritime |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers SMJ27256-20JM, MD27256-20 B, AM27256-20DMB, 8411103YX, 8411103YB under NSN 5962-01-201-1414 of Microcircuit Memory manufactured by Texas Instrument Inc, Intel Corp Sales Office, Owen Laboratories Inc, Advanced Micro Devices Inc, Dla Land And Maritime.
Federal Supply Class of NSN 5962-01-201-1414 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-201-1414, 5962012011414
-
Part No Manufacturer Item Name QTY RFQ SMJ27256-20JM Texas Instrument Inc microcircuit memory Avl RFQ MD27256-20 B Intel Corp Sales Office microcircuit memory Avl RFQ MD27256-20 B Owen Laboratories Inc microcircuit memory Avl RFQ AM27256-20DMB Advanced Micro Devices Inc microcircuit memory Avl RFQ 8411103YX Dla Land And Maritime microcircuit memory Avl RFQ 8411103YB Dla Land And Maritime microcircuit memory Avl RFQ 8411103YA Dla Land And Maritime microcircuit memory Avl RFQ 84111 Dla Land And Maritime microcircuit memory Avl RFQ
Characteristics Data of NSN 5962012011414MRC Criteria Characteristic ADAQ BODY LENGTH 1.485 INCHES MAXIMUM ADAT BODY WIDTH 0.560 INCHES MINIMUM AND 0.625 INCHES MAXIMUM ADAU BODY HEIGHT 0.172 INCHES MINIMUM AND 0.217 INCHES MAXIMUM AEHX MAXIMUM POWER DISSIPATION RATING 1.0 WATTS AFGA OPERATING TEMP RANGE -55.0 TO 125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0 TO 150.0 DEG CELSIUS CBBL FEATURES PROVIDED ULTRAVIOLET ERASABLE AND PROGRAMMABLE AND MONOLITHIC CQSJ INCLOSURE MATERIAL CERAMIC CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC CQZP INPUT CIRCUIT PATTERN 17 INPUT CTQX CURRENT RATING PER CHARACTERISTIC 125.00 MILLIAMPERES MAXIMUM SUPPLY CWSG TERMINAL SURFACE TREATMENT SOLDER CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC -0.6 VOLTS MINIMUM POWER SOURCE AND 6.5 VOLTS MAXIMUM POWER SOURCE CZER MEMORY DEVICE TYPE PROM TEST TEST DATA DOCUMENT 14933-84111 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWIN TTQY TERMINAL TYPE AND QUANTITY 28 PRINTED CIRCUIT
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 1.485 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.560 INCHES MINIMUM AND 0.625 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.172 INCHES MINIMUM AND 0.217 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | ULTRAVIOLET ERASABLE AND PROGRAMMABLE AND MONOLITHIC |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 17 INPUT |
CTQX | CURRENT RATING PER CHARACTERISTIC | 125.00 MILLIAMPERES MAXIMUM SUPPLY |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.6 VOLTS MINIMUM POWER SOURCE AND 6.5 VOLTS MAXIMUM POWER SOURCE |
CZER | MEMORY DEVICE TYPE | PROM |
TEST | TEST DATA DOCUMENT | 14933-84111 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWIN |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |