NSN 5962-01-314-9187 of Microcircuit Digital - Parts Details
Alternative NSN: 5962013149187 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 013149187 |
NCB Code: USA (01) |
Manufacturers: Paeaeesikunta Logistiikkaosasto , Philips Semiconductors Inc , Sertech Laboratories Inc , Stellar Technology Inc , Massachusetts Components Inc , Raytheon Technical Services Company , Raytheon Aircraft , Texas Instrument Inc |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers 10310696, 54S08, G101951-821, G101951-821 B, SNJ54S08 under NSN 5962-01-314-9187 of Microcircuit Digital manufactured by Paeaeesikunta Logistiikkaosasto, Philips Semiconductors Inc, Sertech Laboratories Inc, Stellar Technology Inc, Massachusetts Components Inc.
Federal Supply Class of NSN 5962-01-314-9187 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-314-9187, 5962013149187
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Part No Manufacturer Item Name QTY RFQ 10310696 Paeaeesikunta Logistiikkaosasto microcircuit digital Avl RFQ 54S08 Philips Semiconductors Inc microcircuit digital Avl RFQ 54S08 Sertech Laboratories Inc microcircuit digital Avl RFQ 54S08 Stellar Technology Inc microcircuit digital Avl RFQ 54S08 Massachusetts Components Inc microcircuit digital Avl RFQ G101951-821 Raytheon Technical Services Company microcircuit digital Avl RFQ G101951-821 Raytheon Aircraft microcircuit digital Avl RFQ G101951-821 B Stellar Technology Inc microcircuit digital Avl RFQ SNJ54S08 Texas Instrument Inc microcircuit digital Avl RFQ
Characteristics Data of NSN 5962013149187MRC Criteria Characteristic AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CQSJ INCLOSURE MATERIAL CERAMIC CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN QUAD 2 INPUT CSSL DESIGN FUNCTION AND QUANTITY 4 GATE, AND CWSG TERMINAL SURFACE TREATMENT SOLDER CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 7.0 VOLTS MAXIMUM POWER SOURCE CZEQ TIME RATING PER CHACTERISTIC 7.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 7.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). TTQY TERMINAL TYPE AND QUANTITY 16 LEADLESS CQSZ INCLOSURE CONFIGURATION LEADLESS FLAT PACK CBBL FEATURES PROVIDED HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND ELECTROSTATIC SENSITIVE
MRC | Criteria | Characteristic |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | QUAD 2 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 4 GATE, AND |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
CZEQ | TIME RATING PER CHACTERISTIC | 7.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 7.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 16 LEADLESS |
CQSZ | INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND ELECTROSTATIC SENSITIVE |