5082-2566 by Avago Technologies Us Inc Division with NSN 5961005322956 - Submit a Quote
Part No. : 5082-2566 | Alternate P/N: 50822566 | Manufacturer : Avago Technologies Us Inc Division | NSN : 5961-00-532-2956 |
Item Name : Semiconductor Device Set | CAGE Code : 50434 | FSC : 5961 Semiconductor Devices and Associated Hardware |
ASAP Aviation Procurement is pleased to announce that part number 5082-2566 of NSN 5961005322956 is now available and in stock. We can get you one of the fastest and most competitive quotes on this part. Part number 5082-2566 is a semiconductor device set manufactured by avago technologies us inc division under CAGE Code 50434. Simply fill out the Request for Quote (RFQ) form provided here to get started on your quote.In order to make sure that we get you your quote in a timely manner, please take the time to make sure that all fields are completely filled out, particularly the asterisk-marked (*) fields like Parts Needed By and Quantity (ea).
We will be using your response to these fields to calculate your quote. Within 15 minutes of receiving your RFQ, a member of our sales team will contact you with your quote. ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is a leading distributor of new and obsolete NSN parts for the aerospace, civil aviation, and defense industries. With our inventory of more than 2 billion parts sourced from over 5000 manufacturers from around the world, we do our level best to become your go-to one-stop shop. And to help us offer you the best streamlined parts procurement experience, we have advanced shipping facilities across USA. 5082-2566 avago technologies us inc division is in stock.
Are you interested in learning more about part number 5082-2566? If so, feel free to contact us by phone at +1-714-705-4780, or by email at sales@asap-aviationprocurement.com. And if you are interested in an even faster and more convenient purchasing platform, check out the ASAP Semiconductor App from Google Play or the App Store.
NSN Information for Part Number 5082-2566 with NSN 5961-00-532-2956, 5961005322956
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-532-2956 Item Description: Semiconductor Device Set | 5961 | 005322956 | 0 | N | ||
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | U | |||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
5082-2566 | 2 | 2 | 3 |
Characteristics Data of NSN 5961-00-532-2956, 5961005322956MRC Criteria Characteristic ABBH INCLOSURE MATERIAL CERAMIC ALL SEMICONDUCTOR DEVICE DIODE ABHP OVERALL LENGTH 0.230 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.300 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE ABJT TERMINAL LENGTH 1.000 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE ADAV OVERALL DIAMETER 0.085 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.107 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE AFZC FUNCTION FOR WHICH DESIGNED DETECTOR AND MIXER ASDD COMPONENT FUNCTION RELATIONSHIP MATCHED ASKA COMPONENT NAME AND QUANTITY 2 SEMICONDUCTOR DEVICE DIODE AXGY MOUNTING METHOD TERMINAL ALL SEMICONDUCTOR DEVICE DIODE CTMZ SEMICONDUCTOR MATERIAL SILICON ALL SEMICONDUCTOR DEVICE DIODE CTSG MAXIMUM OPERATING TEMP PER MEASUREMENT POINT 100.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE FEAT SPECIAL FEATURES 3.0 GHZ TEST FREQUENCY; 6.0 DECIBEL NOISE FIGURE TTQY TERMINAL TYPE AND QUANTITY 2 UNINSULATED WIRE LEAD ALL SEMICONDUCTOR DEVICE DIODE
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 0.230 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.300 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.085 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.107 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AFZC | FUNCTION FOR WHICH DESIGNED | DETECTOR AND MIXER |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 100.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE |
FEAT | SPECIAL FEATURES | 3.0 GHZ TEST FREQUENCY; 6.0 DECIBEL NOISE FIGURE |
TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD ALL SEMICONDUCTOR DEVICE DIODE |
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