NSN 5962-00-283-5511 of Microcircuit Digital - Parts Details
Alternative NSN: 5962002835511 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 002835511 |
NCB Code: USA (00) |
Manufacturers: Texas Instrument Inc , Philips Semiconductors Inc , Raytheon Aircraft , Edo Corporation |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers SNM54S40J, SNJ54S40J, SNC54S40J, 537813-1, 500126-1 under NSN 5962-00-283-5511 of Microcircuit Digital manufactured by Texas Instrument Inc, Philips Semiconductors Inc, Raytheon Aircraft, Edo Corporation.
Federal Supply Class of NSN 5962-00-283-5511 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-00-283-5511, 5962002835511
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Part No Manufacturer Item Name QTY RFQ SNM54S40J Texas Instrument Inc microcircuit digital Avl RFQ SNJ54S40J Texas Instrument Inc microcircuit digital Avl RFQ SNC54S40J Texas Instrument Inc microcircuit digital Avl RFQ SNC54S40J Philips Semiconductors Inc microcircuit digital Avl RFQ 537813-1 Raytheon Aircraft microcircuit digital Avl RFQ 500126-1 Edo Corporation microcircuit digital Avl RFQ
Characteristics Data of NSN 5962002835511MRC Criteria Characteristic ADAQ BODY LENGTH 0.785 INCHES MAXIMUM ADAT BODY WIDTH 0.280 INCHES MAXIMUM ADAU BODY HEIGHT 0.200 INCHES MAXIMUM AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS CBBL FEATURES PROVIDED HERMETICALLY SEALED AND HIGH SPEED AND MONOLITHIC AND POSITIVE OUTPUTS AND SCHOTTKY CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC CQZP INPUT CIRCUIT PATTERN DUAL 4 INPUT CSSL DESIGN FUNCTION AND QUANTITY 1 BUFFER, NAND CTFT CASE OUTLINE SOURCE AND DESIGNATOR T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL CZEQ TIME RATING PER CHACTERISTIC 6.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 6.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.785 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.280 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.200 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND HIGH SPEED AND MONOLITHIC AND POSITIVE OUTPUTS AND SCHOTTKY |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | DUAL 4 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 BUFFER, NAND |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CZEQ | TIME RATING PER CHACTERISTIC | 6.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 6.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |