NSN 5962-01-122-8018 of Microcircuit Digital - Parts Details
Alternative NSN: 5962011228018 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 011228018 |
NCB Code: USA (01) |
Manufacturers: Texas Instrument Inc , Advanced Micro Devices Inc , Philips Semiconductors Inc |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers SNC54H151J, SN54S151J-B, S54S151F 883B under NSN 5962-01-122-8018 of Microcircuit Digital manufactured by Texas Instrument Inc, Advanced Micro Devices Inc, Philips Semiconductors Inc.
Federal Supply Class of NSN 5962-01-122-8018 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-122-8018, 5962011228018
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Part No Manufacturer Item Name QTY RFQ SNC54H151J Texas Instrument Inc microcircuit digital Avl RFQ SN54S151J-B Advanced Micro Devices Inc microcircuit digital Avl RFQ S54S151F 883B Philips Semiconductors Inc microcircuit digital Avl RFQ
Characteristics Data of NSN 5962011228018MRC Criteria Characteristic MRC Decoded Requirement Clear Text Reply CQWX Output Logic Form TRANSISTOR-TRANSISTOR LOGIC CBBL Features Provided BURN IN AND MONOLITHIC AND SCHOTTKY ADAT Body Width 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM CQZP Input Circuit Pattern 8 INPUT CQSJ Inclosure Material CERAMIC CSSL Design Function And Quantity 1 SELECTOR, DATA, MULTIPLEXER AFGA Operating Temp Range -55.0/+125.0 DEG CELSIUS CQSZ Inclosure Configuration DUAL-IN-LINE ADAQ Body Length 0.870 INCHES MAXIMUM ADAU Body Height 0.185 INCHES MAXIMUM TEST Test Data Document 15786-308708 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) CZEQ Time Rating Per Chacteristic 18.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 18.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AFJQ Storage Temp Range -65.0/+150.0 DEG CELSIUS
MRC | Criteria | Characteristic |
---|---|---|
MRC | Decoded Requirement | Clear Text Reply |
CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |
CBBL | Features Provided | BURN IN AND MONOLITHIC AND SCHOTTKY |
ADAT | Body Width | 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
CQZP | Input Circuit Pattern | 8 INPUT |
CQSJ | Inclosure Material | CERAMIC |
CSSL | Design Function And Quantity | 1 SELECTOR, DATA, MULTIPLEXER |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
ADAQ | Body Length | 0.870 INCHES MAXIMUM |
ADAU | Body Height | 0.185 INCHES MAXIMUM |
TEST | Test Data Document | 15786-308708 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
CZEQ | Time Rating Per Chacteristic | 18.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 18.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |