NSN 5962-01-311-8944 of Microcircuit Digital - Parts Details
Alternative NSN: 5962013118944 |
Item Name: Microcircuit Digital |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 013118944 |
NCB Code: USA (01) |
Manufacturers: Integrated Device Technology Inc , Drs Icas Llc , Bae Systems , Rockwell Collins Inc , Racal Survey Inc Div Of Racal Da , Thales Uk Limited |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers IDT54FCT521DB, 94600-8, 915464, 34 868-045, 1872710 under NSN 5962-01-311-8944 of Microcircuit Digital manufactured by Integrated Device Technology Inc, Drs Icas Llc, Bae Systems, Rockwell Collins Inc, Racal Survey Inc Div Of Racal Da.
Federal Supply Class of NSN 5962-01-311-8944 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-311-8944, 5962013118944
-
Part No Manufacturer Item Name QTY RFQ IDT54FCT521DB Integrated Device Technology Inc microcircuit digital Avl RFQ 94600-8 Drs Icas Llc microcircuit digital Avl RFQ 915464 Bae Systems microcircuit digital Avl RFQ 34 868-045 Rockwell Collins Inc microcircuit digital Avl RFQ 1872710 Racal Survey Inc Div Of Racal Da microcircuit digital Avl RFQ 1872710 Thales Uk Limited microcircuit digital Avl RFQ
Characteristics Data of NSN 5962013118944MRC Criteria Characteristic AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS CBBL FEATURES PROVIDED BURN IN CQSJ INCLOSURE MATERIAL CERAMIC CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC CQZP INPUT CIRCUIT PATTERN 17 INPUT CSSL DESIGN FUNCTION AND QUANTITY 1 COMPARATOR
MRC | Criteria | Characteristic |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | BURN IN |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 17 INPUT |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 COMPARATOR |