NSN 5962-01-392-2823 of Microcircuit Memory - Parts Details
| Alternative NSN: 5962013922823 |
| Item Name: Microcircuit Memory |
| FSG: 59 Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 013922823 |
| NCB Code: USA (01) |
| Manufacturers: Dla Land And Maritime , Advanced Micro Devices Inc |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers ROM PROM FAMILY 049, PAL16L8ACJ, AMPAL16L8ADC under NSN 5962-01-392-2823 of Microcircuit Memory manufactured by Dla Land And Maritime, Advanced Micro Devices Inc.
Federal Supply Class of NSN 5962-01-392-2823 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-392-2823, 5962013922823
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Part No Manufacturer Item Name QTY RFQ ROM PROM FAMILY 049 Dla Land And Maritime microcircuit memory Avl RFQ PAL16L8ACJ Advanced Micro Devices Inc microcircuit memory Avl RFQ AMPAL16L8ADC Advanced Micro Devices Inc microcircuit memory Avl RFQ
Characteristics Data of NSN 5962013922823MRC Criteria Characteristic AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS" CBBL FEATURES PROVIDED HERMETICALLY SEALED AND PROGRAMMED AND MONOLITHIC" CQSJ INCLOSURE MATERIAL CERAMIC" CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE" CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC" CTFT CASE OUTLINE SOURCE AND DESIGNATOR D-8 MIL-M-38510" CWSG TERMINAL SURFACE TREATMENT SOLDER" CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 12.0 VOLTS MAXIMUM POWER SOURCE" CZEQ TIME RATING PER CHACTERISTIC 30.00 NANOSECONDS MAXIMUM ACCESS" CZER MEMORY DEVICE TYPE PAL" TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)." TTQY TERMINAL TYPE AND QUANTITY 20 PRINTED CIRCUIT" AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS" CBBL FEATURES PROVIDED HERMETICALLY SEALED AND PROGRAMMED AND MONOLITHIC" CQSJ INCLOSURE MATERIAL CERAMIC" CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE" CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC" CTFT CASE OUTLINE SOURCE AND DESIGNATOR D-8 MIL-M-38510" CWSG TERMINAL SURFACE TREATMENT SOLDER" CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 12.0 VOLTS MAXIMUM POWER SOURCE" CZEQ TIME RATING PER CHACTERISTIC 30.00 NANOSECONDS MAXIMUM ACCESS" CZER MEMORY DEVICE TYPE PAL" TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)." TTQY TERMINAL TYPE AND QUANTITY 20 PRINTED CIRCUIT"
| MRC | Criteria | Characteristic |
|---|---|---|
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS" |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND PROGRAMMED AND MONOLITHIC" |
| CQSJ | INCLOSURE MATERIAL | CERAMIC" |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC" |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-8 MIL-M-38510" |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 12.0 VOLTS MAXIMUM POWER SOURCE" |
| CZEQ | TIME RATING PER CHACTERISTIC | 30.00 NANOSECONDS MAXIMUM ACCESS" |
| CZER | MEMORY DEVICE TYPE | PAL" |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)." |
| TTQY | TERMINAL TYPE AND QUANTITY | 20 PRINTED CIRCUIT" |
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS" |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND PROGRAMMED AND MONOLITHIC" |
| CQSJ | INCLOSURE MATERIAL | CERAMIC" |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC" |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-8 MIL-M-38510" |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 12.0 VOLTS MAXIMUM POWER SOURCE" |
| CZEQ | TIME RATING PER CHACTERISTIC | 30.00 NANOSECONDS MAXIMUM ACCESS" |
| CZER | MEMORY DEVICE TYPE | PAL" |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)." |
| TTQY | TERMINAL TYPE AND QUANTITY | 20 PRINTED CIRCUIT" |