NSN 5962-01-455-9723 of Microcircuit Memory - Parts Details
Alternative NSN: 5962014559723 |
Item Name: Microcircuit Memory |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 014559723 |
NCB Code: USA (01) |
Manufacturers: Texas Instrument Inc , Philips Semiconductors Inc , Intersil Corporation , Advanced Micro Devices Inc , Raytheon Aircraft , Mmi Amd |
ASAP Aviation Procurement, owned and operated by ASAP Semiconductor, is the latest parts procurement platform for the aerospace and aviation industry. Check out high demanding part numbers TBP18S030W, SN91027W, S82S123WJ, S82S123AF883B, HM9-7603 under NSN 5962-01-455-9723 of Microcircuit Memory manufactured by Texas Instrument Inc, Philips Semiconductors Inc, Intersil Corporation, Advanced Micro Devices Inc, Raytheon Aircraft.
Federal Supply Class of NSN 5962-01-455-9723 is FSC 5962 contains part details of Microcircuits Electronic. Quote for your desired part numbers.
Part Number's List for NSN 5962-01-455-9723, 5962014559723
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Part No Manufacturer Item Name QTY RFQ TBP18S030W Texas Instrument Inc microcircuit memory Avl RFQ SN91027W Texas Instrument Inc microcircuit memory Avl RFQ S82S123WJ Philips Semiconductors Inc microcircuit memory Avl RFQ S82S123AF883B Philips Semiconductors Inc microcircuit memory Avl RFQ HM9-7603 Intersil Corporation microcircuit memory Avl RFQ CC1648 Philips Semiconductors Inc microcircuit memory Avl RFQ B1585-505B Intersil Corporation microcircuit memory Avl RFQ AM27S19AFMB Advanced Micro Devices Inc microcircuit memory Avl RFQ 932623-505B Raytheon Aircraft microcircuit memory Avl RFQ 82S123A BFA Philips Semiconductors Inc microcircuit memory Avl RFQ 53S081-1F Mmi Amd microcircuit memory Avl RFQ 5331-1F Mmi Amd microcircuit memory Avl RFQ 1009 Mmi Amd microcircuit memory Avl RFQ
Characteristics Data of NSN 5962014559723MRC Criteria Characteristic CRTL Criticality Code Justification CBBL MRC Decoded Requirement Clear Text Reply CQSZ Inclosure Configuration FLAT PACK CBBL Features Provided PROGRAMMABLE AND ELECTROSTATIC SENSITIVE TEST Test Data Document 96906-MIL-STD-883 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). CXCY Part Name Assigned By Controlling Agency MED READ ONLY MEMORY APINTERFACE CZER Memory Device Type PROM AGAV End Item Identification B1B
MRC | Criteria | Characteristic |
---|---|---|
CRTL | Criticality Code Justification | CBBL |
MRC | Decoded Requirement | Clear Text Reply |
CQSZ | Inclosure Configuration | FLAT PACK |
CBBL | Features Provided | PROGRAMMABLE AND ELECTROSTATIC SENSITIVE |
TEST | Test Data Document | 96906-MIL-STD-883 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). |
CXCY | Part Name Assigned By Controlling Agency | MED READ ONLY MEMORY APINTERFACE |
CZER | Memory Device Type | PROM |
AGAV | End Item Identification | B1B |