UXAN1N21WEMR by Micrometrics Inc with NSN 5961000794041 - Submit a Quote
Part No. : UXAN1N21WEMR | Manufacturer : Micrometrics Inc | NSN : 5961-00-079-4041 |
Item Name : Semiconductor Device Set | CAGE Code : 0EFF4 | FSC : 5961 Semiconductor Devices and Associated Hardware |
ASAP Aviation Procurement is pleased to announce that part number UXAN1N21WEMR of NSN 5961000794041 is now available and in stock. We can get you one of the fastest and most competitive quotes on this part. Part number UXAN1N21WEMR is a semiconductor device set manufactured by micrometrics inc under CAGE Code 0EFF4. Simply fill out the Request for Quote (RFQ) form provided here to get started on your quote.In order to make sure that we get you your quote in a timely manner, please take the time to make sure that all fields are completely filled out, particularly the asterisk-marked (*) fields like Parts Needed By and Quantity (ea).
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NSN Information for Part Number UXAN1N21WEMR with NSN 5961-00-079-4041, 5961000794041
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-079-4041 Item Description: Semiconductor Device Set | 5961 | 000794041 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | G | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Uxan1n21wemr | 1 | 1 | 5 |
Characteristics Data of NSN 5961-00-079-4041, 5961000794041MRC Criteria Characteristic ABBH INCLOSURE MATERIAL CERAMIC ALL SEMICONDUCTOR DEVICE DIODE ABHP OVERALL LENGTH 0.800 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.840 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE ADAV OVERALL DIAMETER 0.222 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.240 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE AFZC FUNCTION FOR WHICH DESIGNED MIXER ASDD COMPONENT FUNCTION RELATIONSHIP MATCHED ASKA COMPONENT NAME AND QUANTITY 2 SEMICONDUCTOR DEVICE DIODE AXGY MOUNTING METHOD PRESS FIT ALL SEMICONDUCTOR DEVICE DIODE CBBL FEATURES PROVIDED GOLD PLATED LEADS CTMZ SEMICONDUCTOR MATERIAL SILICON ALL SEMICONDUCTOR DEVICE DIODE CTSG MAXIMUM OPERATING TEMP PER MEASUREMENT POINT 150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE PMLC III PRECIOUS MATERIAL AND LOCATION TERMINAL SURFACES GOLD PRMT III PRECIOUS MATERIAL GOLD TEST TEST DATA DOCUMENT 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI TTQY TERMINAL TYPE AND QUANTITY 2 PIN ALL SEMICONDUCTOR DEVICE DIODE ZZZK SPECIFICATION/STANDARD DATA 81349-MIL-S-19500/232 GOVERNMENT SPECIFICATION
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 0.800 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.840 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.222 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.240 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AFZC | FUNCTION FOR WHICH DESIGNED | MIXER |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | PRESS FIT ALL SEMICONDUCTOR DEVICE DIODE |
CBBL | FEATURES PROVIDED | GOLD PLATED LEADS |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE |
PMLC | III PRECIOUS MATERIAL AND LOCATION | TERMINAL SURFACES GOLD |
PRMT | III PRECIOUS MATERIAL | GOLD |
TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI |
TTQY | TERMINAL TYPE AND QUANTITY | 2 PIN ALL SEMICONDUCTOR DEVICE DIODE |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/232 GOVERNMENT SPECIFICATION |
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